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Product Overview





VK-X100/X200 Series





3D Laser Scanning Microscope





    200x - 24,000x magnification





    0.5 nanometer Z-axis resolution on almost any material





    High-resolution, large depth-of-field observation





    Profile and roughness measurements with zero sample preparation





    Measures thickness and uniformity of clear layers





    No data loss - even on steep angles





    Perform measurements with just a single click





Combines the capabilities of an optical microscope, SEM and roughness gauge

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